2012 CIE Lecture on Photometry, Colorimetry, Metrology and Standards for SSL Lighting
Date: September 16-18, 2012 (Sunday-Tuesday)
Venue: Yuanzheng Qizhen Hotel
Organizers: International Commission on Illumination (CIE) and China Illuminating Engineering Society (CIES)
Host: Colour Institute, Zhejiang University, Hangzhou
Registration & Fees
These CIE Lectures are intended to provide the most up-to-date knowledge in the field of colour and vision science as well as illuminating engineering. This particular course is divided into three sessions:
- CIE Colorimetry
- Metrology and Applications for SSL and LED Lighting and
- Standards Development for SSL and LED Lighting
The first session will cover the fundamentals of colour science and recent developments in CIE Division 1 (Vision and Colour) whereas the other two will include metrology, applications, and standards for SSL and LED lighting. The lectures will be given by the world leading experts: Ming Ronnier Luo, Yoshi Ohno and Janos Schanda.
Lecturer: Dr. Ming Ronnier Luo
Lecturer: Dr. Janos Schanda
Lecturer: Dr. Yoshi Ohno
Dr. Ming Ronnier Luo
|Ming Ronnier Luo is Professor at Zheijiang University, Hangzhou, China and Professor of Colour and Imaging Science at the University of Leeds, UK. He is also Director of Division 1 (Colour and Vision) of the Commission International de l’Eclairage (CIE). He received his PhD in 1986 at the University of Bradford. He has over 350 publications in the field of colour appearance modelling, colour difference evaluation and colour management of digital imaging products. He is a Fellow of the Society of Dyers and Colourists and the Society for Imaging Science and Technology. He chairs two CIE Technical Committees and has received various research medals from different learned societies.|
Dr. Janos Schanda
|Professor Emeritus of the University of Veszprém, Hungary|
He headed there the Department of Image Processing and Neurocomputing. Since his retirement he is Professor Emeritus and advisor for the “Virtual Reality and Imaging Laboratory”.
During the nineteen eighties and nineteen nineties he worked for the International Commission on Illumination (CIE) as its General Secretary and later Technical Manager. He served also in a number of honorary positions of the CIE, is Past Vice President, has chaired several Technical Committees, among others dealing with fundamentals of photometry, colorimetry and colour rendering. He is Honorary President of the Hungarian Lighting Society.
Dr. Schanda is member of the Optical Society of America, of The Society for Imaging Science and Technology and of several Hungarian Societies in the field of light and lighting and optical measurement. He served also on the Board of the International Colour Association (AIC) as its vice-president. He is recipient of the Newton Medal of the British Colour Group and of the De Boer Pin of the CIE.
He is on the editorial / international advisory board of Color Res. & Appl., USA, Lighting Research & Technology, UK and Journal of Light & Visual Environment, Japan. He is author of over 500 technical papers and conference lectures.
Dr. Yoshi Ohno
Yoshi Ohno is a NIST Fellow and the Group Leader for Lighting and Color Group at Sensor Science Division, National Institute of Standards and Technology, USA. His group maintains the national standards of the lumen, candela, and other photometric units and colorimetric scales for USA. He received his Ph.D. in engineering from Kyoto University, Japan. He started his career at Panasonic Corp., Osaka Japan before joining NIST in 1992. Yoshi Ohno is actively involved in research of photometry and colorimetry. Specific projects of interest include integrating sphere theory, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting. He served as Director of CIE Division 2 for 2007-2011, and currently serves as CIE Vicepresident Technical. He is a Fellow of IESNA, NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and is active in technical committees in CIE, ISO, ANSI, and IESNA. Ohno received several awards including the CIE de Boer Gold Pin Distinguished Service Award in 2007 and U.S. Department of Commerce Silver Medal Award in 2009.